The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Dec. 18, 1998
Applicant:
Inventors:
Ikuo Kitao, Tokyo, JP;
Yoshiyuki Hatano, Tokyo, JP;
Toshihiro Iwai, Tokyo, JP;
Takeshi Nakamura, Tokyo, JP;
Hisao Fujinuma, Tokyo, JP;
Shinji Uno, Tokyo, JP;
Jun Akiyama, Tokyo, JP;
Assignee:
Kabushiki Kaisha Topcon, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
B24B / ; B24B / ;
U.S. Cl.
CPC ...
451 43 ;
Abstract
A lens shape measuring apparatus is provided which comprises lens rotating shafts (16, 17) for rotatably holding an uncut lens, a feeler (63, 219, 220) disposed in contact with a working locus of the front or rear surface of the lens, and a calculation/control circuit (100) for detecting a difference in surface level of the lens from a change in data measured by the feeler (63, 219, 220) and controlling the contact of the feeler with the lens.