The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Sep. 01, 1998
Wieland E Von Behrens, Dallas, TX (US);
Roger Bourree, Cedar Hill, TX (US);
George Chappell, DeSoto, TX (US);
James G Young, Grand Prairie, TX (US);
MWI, Inc., Dallas, TX (US);
Abstract
An apparatus for analyzing particulates including solutes in a sample liquid suspension in which the sample liquid suspension flows through an aperture into a first region of a reservoir containing particle free liquid to form a jet which entrains particle free liquid to ensheathe the jet. The jet passes through a muffler which includes a funnel and a throat into a second region of said reservoir where the particle free liquid and particulates are mixed. The throat is configured to prevent regurgitation of liquid from the second region back into the first region. A return passage connects the second region of the reservoir to the first region. The energy of the jet stream causes liquid to flow from the second region to the first region to provide particle free liquid to the first region. The return passage is configured or contains means to continuously mix the advancing liquid to prevent central streamers and the peripheral Coanda effect. This assures that during particle analysis only clean liquid reaches the first region, and that during cleanout particle free liquid admitted into the first region displaces all analyzed sample liquid without carryover.