The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Nov. 05, 1997
William Freund, Houston, TX (US);
Winsor Letton, Houston, TX (US);
James McClellan, Marietta, GA (US);
Baocang Jia, Houston, TX (US);
Anni Wey, Houston, TX (US);
Wen Chang, Sugar Land, TX (US);
Daniel Industries, Inc., Houston, TX (US);
Abstract
An apparatus for measuring the time of flight of a signal is provided. The apparatus for measuring the time of flight of a signal comprises a transmitter for emitting a signal, a receiver for receiving the signal from the transmitter, and means for detecting the onset of the signal as it arrives at the receiver such that the period of time from emission by the transmitter to the time the receiver initially receives the signal can be determined. In another embodiment, the present invention provides a method for determining the time of flight of a signal comprising the steps of receiving a transmitted signal, operating on the received signal for generating a pre-conditioned signal, conditioning the pre-conditioned signal for removing irregularities therefrom for generating a conditioned signal, operating on the conditioned signal to form a discriminated signal, and determining the critical point of the discriminated signal such that the critical point can be used to determine the time of flight of the signal from the instant of transmission to the instant reception.