The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Nov. 26, 1997
Seung Ho Ahn, Daejeon, KR;
Sang Ho Park, Daejeon, KR;
Oh Gone Chun, Daejeon, KR;
Myung Yung Jeong, Daejeon, KR;
Tae Goo Choy, Daejeon, KR;
Han Dae Cho, Kyunggi-do, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Korea Telecom, Seoul, KR;
Abstract
A compound testing machine for testing mechanical properties used for an optical connector does not additionally have each testing machine for each of mechanical properties (such as a tensile force including both a straight pull and a side pull, a flex, a twist and an impact) in testing a mechanical property between optical connectors and other mechanical property between optical fibers of the optical connectors, and includes only one testing machine for simultaneously testing various mechanical properties in order to enhance a test machine's efficiency. The compound testing machine includes: a rotation part which includes a test specimen fixing portion for fixing a test specimen, a cable connected to the test specimen, and a load applying portion connected to the cable so as to provide a predetermined load to the test specimen, receives a driving force of an electric motor, and measures a tensile force and a flex; and an impact testing part which is mounted to one side of the rotation part, drops the test specimen while freely adjusting a height of the test specimen, and thus performs an impact test.