The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 1999
Filed:
Dec. 16, 1996
Samsung Electronics, Co., Ltd., Suwon, KR;
Abstract
A multi-bit data block testing circuit and method thereof are described. The semiconductor memory device includes a multi-bit data block testing circuit for testing adjacent cell blocks using any one pattern selected from the same data pattern and a different data pattern during a multi-bit test mode. The multi-bit data block testing circuit further comprises a comparator operatively coupled to receive a data signal from each of the adjacent cell blocks. A multi-bit data block input source is interconnected with the multi-bit data block testing circuit via an input port and provides the data patterns during the multi-test mode. A multi-bit data block output receiver is interconnected with the multi-bit data block testing circuit via an output port and receives a test result indication from the comparator of the multi-bit data block testing circuit.