The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 1999

Filed:

Dec. 22, 1998
Applicant:
Inventors:

Hironori Ohwaki, Shizuoka-ken, JP;

Koji Yamazaki, Odawara, JP;

Toshiyuki Ehara, Yokohama, JP;

Masaya Kawada, Nara, JP;

Takaaki Kaya, Mishima, JP;

Tetsuya Karaki, Shizuoka-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G / ; G03G / ;
U.S. Cl.
CPC ...
399 48 ; 324457 ; 399 73 ;
Abstract

In a surface potential measuring apparatus for measuring a potential configuration by moving a photosensitive body of an image forming apparatus of electrophotographic type and at least one potential sensor relative to each other and by generating dielectric current in the potential sensor due to change in potential on a surface of the photosensitive body and by analyzing the dielectric current, a width of a detecting portion of the potential sensor is smaller than a width of the change in potential to be measured, and a sectional shape of the detecting portion in a plane perpendicular to the surface of the photosensitive body and parallel to the relative movement direction does not include any edge.


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