The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 1999

Filed:

Apr. 13, 1998
Applicant:
Inventors:

Thomas L Toth, Brookfield, WI (US);

Neil B Bromberg, Milwaukee, WI (US);

Assignee:

General Electric Company, Milwaukee, WI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378 19 ; 378901 ;
Abstract

Methods and apparatus for dose reduction in a computed tomography (CT) system are described. In one embodiment, the CT system includes a configurable multislice detector array and an adjustable source collimator. The detector array includes a photodiode cell array optically coupled to a scintillator array. The photodiode array includes a plurality of photodiodes arranged in rows and columns that may be combined to collect slice data from a number of inner and outer slices. The CT system also includes an x-ray source and a collimator. The x-ray source generates an x-ray beam that is collimated by the collimator to define the thickness of each outer slice. In operation, an operator determines the quantity and thickness of inner slices and the thickness of each outer slice. After altering the detector and collimator configuration, as defined by an operator, slice data for each inner slice and each outer slice is gathered.


Find Patent Forward Citations

Toth, Thomas. (1999). Methods and apparatus for dose reduction in a computed tomograph (U.S. Patent No. 5982846). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5982846

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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