The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 1999

Filed:

May. 14, 1997
Applicant:
Inventors:

Barbara J Duffner, Fort Collins, CO (US);

Martin Fischer, Heilbronn, DE;

Ronnie E Owens, Fort Collins, CO (US);

Assignee:

Hewlett-Packard Co., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L / ;
U.S. Cl.
CPC ...
375354 ; 713500 ; 713503 ;
Abstract

A method and apparatus are provided for accomplishing virtual deskewing of device-under-test data received by a test system by skewing clock signals instead. In a preferred embodiment, the invention includes a receiver circuit which is capable of operating in a window compare mode to capture a transition of a data signal from either a low data state to a high data state or a high data state to a low data state. The receiver circuit receives a high-level comparator signal and a low-level comparator signal, which when properly deskewed, together indicate what state the data signal is in.


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