The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 1999
Filed:
Jun. 09, 1997
Blair D Pendleton, Colorado Springs, CO (US);
Manfred R Arndt, Colorado Springs, CO (US);
Fluke Corporation, Everett, WA (US);
Abstract
A test instrument and method for testing switched LANs using a set of available MIBs in a switch is provided. The test instrument is designed for the characterization, diagnosis, and testing of a LAN having at least one switch which divides the network traffic into segments. A network device such as a switch will have a set of available MIBs, usually determined by the vendor, which may be accessed via an SNMP agent in the switch. Using the information selectively gathered from this set of available MIBs, various reports may be generated and displayed as reports which allow for a detailed analysis of switch parameters and traffic patterns. For any given report, optimal data items are chosen according to a predetermined hierarchy which provide the most pertinent, detailed information for each given report.