The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 1999
Filed:
Aug. 07, 1997
Shinya Inoue, Falmouth, MA (US);
Keisuke Suzuki, Yokohama, JP;
Koji Ichie, Nagoya, JP;
Chikara Nagano, Hino, JP;
Naobumi Okada, Asaka, JP;
Hajime Takahashi, Hachioji, JP;
Marine Biological Laboratory, Woods Hole, MA (US);
Olympus Optical Co., Ltd., Tokyo, JP;
Hamamatsu Photonics K.K., Hamamatsu, JP;
Abstract
A centrifuge microscope includes a disk which is rotatable around a rotation axis and which is provided with a sample chamber for accommodating a sample. An observation optical system is provided which includes an objective lens which is positioned such that the sample chamber crosses an optical axis of the objective lens as the disk rotates. A pulsed laser source is provided for emitting a pulsed laser to the sample at a timing at which the sample chamber crosses the optical axis of the objective lens. And a delay time adjusting section is provided for adjusting a delay time of an emission timing of the pulsed laser in accordance with a rotational speed of the disk.