The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 1999
Filed:
Feb. 09, 1998
Gan Zhou, Altadena, CA (US);
Demetri Psaltis, Pasadena, CA (US);
Fai Mok, West Hills, CA (US);
Allen Pu, Pasadena, CA (US);
Holoplex, Inc., Pasadena, CA (US);
Abstract
A method and a system to re-align onto a detector array a holographic image of a Fourier region hologram stored in a medium, with the medium spinning around a first axis, and the hologram being generated by a reference beam and a signal beam. In generating the hologram, the reference beam is incident on the medium with respect to a second axis at a second-axis-incident angle, and a third axis at a third-axis-incident angle, such that the holographic image of the hologram when reproduced by the reference beam is aligned onto the detector array. Also, the three axes are substantially orthogonal to each other. As the medium spins, the medium's orientation can change through tilting with respect to the second and the third axes so that the holographic image when reproduced by the reference beam is not aligned onto the detector array. In one embodiment, the holographic image is re-aligned onto the detector array by tilting the reference beam such that when re-aligned, the incident angle of the reference beam on the medium with respect to the second axis is intentionally tilted to be different from the second-axis-incident angle, and with respect to the third axis to be different from the third-axis-incident angle.