The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 1999
Filed:
Apr. 23, 1998
Chung-Tao David Wang, Melville, NY (US);
AIL Systems, Incorporated, Deer Park, NY (US);
Abstract
A method for improving the sensitivity of a Fourier transform infrared (FTIR) spectrometer, especially one which is mounted on a movable platform, includes the step of obtaining a background spectrum and an analytical spectrum from an interferogram, and determining the absorption spectrum from the analytical spectrum and the background spectrum. Then, a classical least squares analysis is applied to the absorption spectrum, with reference to a reference spectrum. The classical least squares analysis removes the bias term, and the first and the second-order correction terms related to frequency from the measured absorption spectrum. The method preferably includes two feedback paths in which the background spectrum used in the analysis is derived from a current background spectrum and previously occurring, co-added background spectra using a weighted average approach. The other feedback path involves using one or more alternative reference spectra should a saturation condition exist.