The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 1999

Filed:

Feb. 26, 1998
Applicant:
Inventors:

Richard H Clarke, Boston, MA (US);

M Edward Womble, Watertown, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ;
U.S. Cl.
CPC ...
356301 ;
Abstract

The present invention provides an apparatus for measuring a property of a sample using low resolution Raman spectroscopy. The apparatus includes a multi-mode laser element, a wavelength dispersion element, a detector, and a processor. The multi-mode laser element irradiates a sample with laser radiation to produce a Raman spectrum. The collection element collects the radiation scattered from the molecules of the sample and transmits the scattered radiation to the dispersion element. The dispersion element disperses the scattered radiation into different wavelength components. The detection array detects the different wavelength components. A processor processes data from the detector array to identify a constituent or to measure a property of the sample. The apparatus preferably has a resolution of between 30 cm.sup.-1 and 50 cm.sup.-1. The resolution of the apparatus being determined in part by the spectral full width at half maximum of the multi-mode laser, and, in part, by the dispersion element.


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