The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 1999

Filed:

Jun. 14, 1996
Applicant:
Inventors:

Hiroshi Ueda, Tokyo, JP;

Teruyuki Nagamune, Saitama, JP;

Hajime Nishimura, Kanagawa, JP;

Izumi Kumagai, Miyagi, JP;

Kouhei Tsumoto, Miyagi, JP;

Walter C Mahoney, Benicia, CA (US);

Greg Winter, Cambridge, GB;

Paula A Schueler, Benicia, CA (US);

Assignee:

Boehringer Mannheim Corporation, Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
435-74 ; 435-792 ; 436518 ;
Abstract

This invention provides a method for measuring an antigen concentration in a sample, which comprises: preparing VH-domain polypeptide and VL-domain polypeptide of an antibody specific to the antigen; labeling one of the polypeptides with a reporter molecule to form labeled polypeptides, and immobilizing the other polypeptides onto solid-phase to form immobilized polypeptides; contacting the antigen-containing sample and the labeled polypeptides with the solid-phase; and measuring the reporter molecule of the labeled polypeptides bound to the immobilized polypeptides. The present invention permits simpler and quicker sandwich ELISA for measurements of an antigen concentration in high sensitivity.


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