The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 1999

Filed:

Feb. 17, 1998
Applicant:
Inventors:

Merrilou George, Jericho, VT (US);

Timothy E Neary, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F / ;
U.S. Cl.
CPC ...
430-5 ;
Abstract

A method for repairing a defect in an opaque layer of a photomask by applying a photoresist layer over the opaque layer and then removing the photoresist over the defect to reveal the defect which is repaired by a wet etch. The repair procedure of the present invention is 'self-aligning' in that the portion of the photoresist layer covering the defect, prior to being removed, extends to the edges of the defect, so that only this portion of the photoresist layer is removed to reveal only the defect in the opaque layer.


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George, Merrilou. (1999). Method for repairing photomasks (U.S. Patent No. 5981110). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5981110

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