The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 1999
Filed:
Oct. 24, 1996
Hajime Ikuno, Aichi, JP;
Masanao Hori, Aichi, JP;
Kabushiki Kaisha Toyota Chuo Kenkyusho, Aichi-ken, JP;
Abstract
An apparatus and method for testing thermal fatigue resistance. The apparatus utilizes a unified heating device and cooling device so that the apparatus is smaller and simpler and a more even temperature distribution can be obtained. The apparatus has at least one gas duct facing the test unit and a device for supplying the duct with a compressed gas flow. A plurality of gas ducts may be used which face plural points on the test unit from plural directions. Thermocouples are placed on several points on the test unit and the temperatures of the points measured. Swift and precise testing of thermal fatigue resistance can be performed by a feedback control of each heating device based on the measured temperature. Thermal strains are caused in certain parts of the test unit due to differences of thermal expansion between members of the test unit.