The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 09, 1999
Filed:
Mar. 28, 1997
Daniel L Nower, Knoxville, TN (US);
CSI Technology, Inc., Wilmington, DE (US);
Abstract
Alignment data is analyzed to determine machine condition information that is not necessarily related to alignment. Alignment fixtures provide alignment data to an analyzer that finds a curve of a predetermined type, such as a sine curve, that best fits the data. A confidence factor is calculated indicating the probability that the alignment data corresponds to misalignment. The alignment data is further analyzed to determine a condition, other than misalignment, that contributed to the magnitudes of the alignment data. Preferably, the analyzer is used to check for machine conditions such as looseness in the machine, rubs, and spall defects in a bearing. Preferably, the condition analysis is based on both the confidence factors and curve parameters, such as phase, offset and amplitude of a sine curve. In the condition analysis mode, the analyzer provides both manual and automatic routine for removing selected segments of data to produce trial data sets that are analyzed to determine machine conditions.