The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 1999

Filed:

Jul. 14, 1997
Applicant:
Inventors:

Daisuke Watari, Kariya, JP;

Sanae Hirata, Okazaki, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B / ; G06F / ;
U.S. Cl.
CPC ...
364184 ; 714736 ; 701 43 ;
Abstract

A monitoring process of a subordinate CPU executes a monitoring subroutine based on external data to check if a main CPU is operating properly or not. A ROM stores test input data for the monitoring subroutine and reference data that should be obtained by the monitoring subroutine based on the test input data. The subordinate CPU alternately executes the monitoring process and a logic determination process which executes the monitoring subroutine based on the test input data. When the monitoring subroutine gives results different from the reference data, the logic determination process determines that there is an abnormality in the monitoring subroutine.


Find Patent Forward Citations

Watari, Daisuke. (1999). Control system having effective error detection capabilities (U.S. Patent No. 5980081). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5980081

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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