The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 1999

Filed:

Nov. 19, 1997
Applicant:
Inventors:

Arun Chandra, Austin, TX (US);

Douglas Craig Bossen, Austin, TX (US);

Nandakumar Nityananda Tendolkar, Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714 43 ; 714 47 ; 714 25 ;
Abstract

A first set of test instructions are provided for a first node in a computer network. A corresponding second set is provided for a second node in the network. The test instruction sets are partitioned into modules. The nodes process their respective sets of test instructions independently to generate test results for each module on each node, except when a synchronizing event occurs. Each node stores its test results for each test module. Since the test modules have an ordered processing sequence, each node's test results for corresponding test modules can be compared asynchronously on an ongoing basis.


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Chandra, Arun. (1999). Run time error probe in a network computing environment (U.S. Patent No. 5978936). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5978936

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