The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 1999

Filed:

Apr. 09, 1996
Applicant:
Inventors:

Rakesh Agrawal, San Jose, CA (US);

Kyuseok Shim, Bedminster, NJ (US);

Ramakrishnan Srikant, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
707-3 ; 707-4 ; 707101 ;
Abstract

A method and system are disclosed for performing spatial similarity joins on high-dimensional points that represent data objects of a database. The method comprises the steps of: generating a data structure based on the similarity distance .epsilon. for organizing the high-dimensional points, traversing the data structure to select pairs of leaf nodes from which the high-dimensional points are joined, and joining the points from selected pairs of nodes according to a joining condition based on the similarity distance .epsilon.. An efficient data structure referred to as an .epsilon.-K-D-B tree is disclosed to provide fast access to the high-dimensional points and to minimize system storage requirements. The invention provides algorithms for generating the .epsilon.-K-D-B tree using biased splitting to minimize the number of nodes to be examined during join operations. The traversing step includes joining selected pairs of nodes and also self-joining selected nodes. Alternatively, the data structure is an R+tree generated using biased splitting.


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