The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1999
Filed:
Jun. 02, 1997
Horst Adams, Nonnenhorn, DE;
Wagner International AG, Altstatten, CH;
Abstract
Apparatus and method of determining the surface condition of a workpiece, operate by measuring a roughness profile of the surface across a certain measuring distance, splitting up the roughness profile into wave frequencies and amplitudes associated with them, dividing the wave frequencies into wave frequency ranges, and determining the surface condition of the workpiece based on the amplitudes in the respective wave frequency ranges. The roughness profile may be understood as the superpositioning of harmonic oscillations having certain wavelengths and amplitudes. By subjecting them to a Fourier analysis, these harmonic oscillations are split up into their wave frequencies and associated amplitudes. Then wave frequency ranges are combined to form bands such that a high intensity in one of the bands each corresponds to a certain physical appearance of the surface. The invention thus provides an objective, calculable measure of the surface condition of a workpiece.