The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1999
Filed:
Feb. 27, 1998
Applicant:
Inventor:
Kiyoshi Masuda, Numazu, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G / ;
U.S. Cl.
CPC ...
399159 ; 399 47 ; 399 48 ;
Abstract
A method and system for measuring sensitivity of an electrophotography photoconductor. The sensitivity is determined using changing information of the surface potential of the photoconductor and an exposure amount information which is precisely obtained by measuring relative illuminance on the surface of the photoconductor with a photo-sensor disposed between a shutter performing ON/OFF operations of light and the photoconductor while the photoconductor is exposed to light. Then, a changing curve of digitized measured relative illuminance is integrated from a rising point thereof to a point thereof at a time when the surface potential information becomes a specified value.