The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 1999

Filed:

Aug. 07, 1997
Applicant:
Inventors:

Junichi Hakamada, Ibaraki, JP;

Koichi Hashimoto, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
395109 ; 382237 ; 382270 ; 350457 ; 350426 ; 350465 ; 350466 ;
Abstract

An image processing method for determining a characteristic of image data in each area in whole image area and performing binarization processing appropriate for the characteristic, the method comprises the steps of: calculating gradation levels around a pixel in the image data; selecting a threshold value matrix appropriate for the pixel, in response to the calculating step, from the group consisting of a threshold value matrix consisting of single threshold value elements for simple binarization, a threshold value matrix comprising different threshold value elements for halftone processing, and at least one threshold value matrix comprising interpolation of both the threshold value matrixes; and binarizing the pixel by a systematic dither method using the threshold value matrix which is selected in the selecting step.


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