The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1999
Filed:
Jun. 26, 1997
Shogo Horinouchi, Fukuoka, JP;
Shigeki Takeuchi, Yamaga, JP;
Kazuhiko Higo, Miyazaki, JP;
Hideki Yoshinaka, Omuta, JP;
Toshihiro Koga, Kurume, JP;
Jiro Mimasa, Fukuoka, JP;
Hidehiro Kugisaki, Omuta, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
In an optical pickup, light, emitted from a light-emitting element, is transmitted through a first beam splitter film with polarization selectivity, and a zero-order diffraction beam and two (.+-.) first order diffraction beams are produced. These beams are applied in a condensed manner to an optical disk through a condensing element, and the return light beam from the optical disk is fed to a photodetector through a second beam splitter film with polarization selectivity, thereby effecting the recording and reproduction of information, the tracking and the focusing. A diffusion angle conversion hologram is provided between the light-emitting element and the first beam splitter film, and with respect to the diffusion angle conversion hologram, the relation between the diffusion angle of the incident beam and the diffusion angle of the outgoing beam is specified. With this arrangement, the light to be incident on the condensing element can have an ideal spherical wave free from a wave aberration, so that an image spot on the optical disk can be condensed into a diffraction limit, and besides by correcting the phase of the beam, a RF signal with a high C/N ratio, a stable focus error signal and a stable track signal are detected.