The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1999
Filed:
Aug. 14, 1998
Applicant:
Inventor:
Shintaro Kudo, Kawasaki, JP;
Assignee:
Nikon Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359656 ;
Abstract
A high-magnification immersion microscope objective 10 capable of being fabricated relatively easily, and wherein field flatness is well-corrected and the image quality is good even at the periphery of the field. The microscope objective comprises, objectwise to imagewise, a first lens group G1 having positive refractive power, a second lens group G2 having positive refractive power, and third lens group G3 having negative refractive power. First lens group includes four single positive lenses (L11 to L14), and second lens group G2 has a plurality of cemented lenses (L21 and L22). The microscope objective preferably satisfies at least one of a number of design conditions.