The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 1999

Filed:

Apr. 28, 1997
Applicant:
Inventors:

Yoshinari Takayama, Ibaraki, JP;

Toshikazu Baba, Ibaraki, JP;

Atsushi Hino, Ibaraki, JP;

Ichiro Amino, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324754 ; 324761 ;

Find Patent Forward Citations

Takayama, Yoshinari. (1999). Multilayer probe for measuring electrical characteristics (U.S. Patent No. 5977783). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5977783

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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