Method and system for optimizing cathode output for aging a cathode ray

Abstract

The present invention relates to a method and system for optimizing the output of at least two electron guns in a cathode ray tube for aging the cathode ray tube during manufacture. The system comprises at least two electron guns located in the cathode ray tube and a memory configured to store an offset value that is representative of a difference between a maximum output level and a detected output level for each of the electron guns. The system further comprises a processor coupled to the memory. The processor generates a first scaled signal by adding a first signal representative of an input voltage corresponding to the detected output level of the first electron gun and an offset signal representative of the offset value, and a second scaled signal by adding a second signal representative of an input voltage corresponding to the detected output level of the second electron gun and the offset signal. A first summing circuit is coupled between the processor and the first electron gun, which combines a first control signal and the first scaled signal to provide a first aging signal to the first electron gun. A second summing circuit is coupled between the processor and the second electron gun, which combines a second control signal and the second scaled signal to provide a second aging signal to the second electron gun. The optimizing technique may also be applied to a third electron gun.