The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1999
Filed:
Oct. 08, 1998
Hiroshi Iijima, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
Disclosed herein is an ophthalmic instrument comprising: an optical measuring section (101) for housing an optical system that measures characteristics of an object eye; an alignment detecting optical system (17') for optically detecting an offset quantity in alignment between the optical measuring section and the object eye; drive units (102 and 103) for moving the optical measuring section (101) vertically, laterally, and longitudinally on the basis of the offset quantity detected by the alignment detecting system (17'); and a control circuit (51) for transmitting a signal which instructs start of measurement to the optical measuring section (101) when the alignment detecting system detects that the object eye has been moved within a measurable area. Prior to the start of measurement the control circuit (51) continues to move the optical measuring section (101) for only a predetermined time so that the object eye (optical axis Oe of the object eye) is moved within a drive target area smaller than the measurable area and also included in the measurable area.