The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1999
Filed:
Jan. 02, 1998
Richard L Trantow, Cincinnati, OH (US);
General Electric Company, Cincinnati, OH (US);
Abstract
An apparatus for ultrasonically scanning a surface includes a plurality of pairs of 180 degree oppositely disposed transducers mounted in a rotatable head having a central axis about which the head is rotatable. A positioning system for positioning the transducers such that all beam axes of the transducers intersect the central axis at a single point. Axes of each pair are equiangular with respect to the centerline and axes of different pairs have incident and reflective angles between beam axes and the central axis that are different from those of other pairs. Incident and reflective angles of different pairs of transducers are preferably predetermined and in close proximity to a predetermined angle over a range of angles bracketing a predetermined critical angle. A translating system is preferably included for effecting translational motion between the head and the surface such that the single point lies substantially on the surface during scanning. The present method further provides a non-destructive material evaluation technique to determine effective Rayleigh wave critical angles using the apparatus. The effective critical angle may be determined from an angular beam intensity profile generated from the beam intensity data provided by each pair of fixed angle transducers.