The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 1999

Filed:

Aug. 05, 1997
Applicant:
Inventors:

Takashi Mizokawa, Kyoto, JP;

Katsuhiro Hirayama, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
714727 ; 714734 ;
Abstract

In a mixed signal integrated circuit containing both an analog core circuit and a digital core circuit, a plurality of dedicated analog boundary scan cells disposed around the analog core circuit are connected in series by a dedicated analog boundary scan path. A plurality of dedicated digital boundary scan cells disposed around a digital core circuit are connected in series by a dedicated digital boundary scan path. The analog and digital boundary scan paths are independent of each other. In testing the analog or digital core circuit, the boundary scan path dedicated thereto is selected so that sets of test control data or test data are shifted only in the boundary scan cells dedicated thereto. As a consequence, a test pattern is shortened and the analog or digital core circuit can efficiently be tested in a shorter period of time.


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