The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1999
Filed:
Sep. 30, 1997
Robert Lennie, Sunnyvale, CA (US);
Charles W Johnson, San Jose, CA (US);
Larry Emlich, San Jose, CA (US);
John Lonczak, Sunnyvale, CA (US);
Tandem Computers Incorporated, Cupertino, CA (US);
Abstract
A method of checking a large and/or replicated databases includes forming a position sensitive checksum for each entry of the database to be used in the check. The checksums are then exclusive Ored with one another to form a first database checksum. Periodically, the checksums are again created from each of the entries of the check and a second database checksum formed and compared to the first for a match that indicate checked entries of the database have not changed. In another embodiment, a modification to one of the check entries may be provided, accompanied by a master checksum indicative of what the first checksum should be after the entry is modified. The database entry is modified, and a position checksum value for the entry as modified is created. The checksum value for the modified entry, and for the entry before the modification, are exclusive OR with the first checksum value, and that result compared with the master checksum to ensure that the modification was properly made and that the database remains credible.