The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 1999

Filed:

Feb. 28, 1996
Applicant:
Inventors:

Atsuo Kawaguchi, Saitama-ken, JP;

Hiroshi Motoda, Saitama-ken, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714 42 ; 714 54 ; 714719 ;
Abstract

A method of managing a memory area, in a data processing system, comprising providing a managing information memory area for items of in use, test done, and temporary fault of pages in a page table for managing a memory unit. In accordance with such a scheme, when a page is allocated to a program, an operation test is conducted on a page not tested, the time when the operation test has been conducted is recorded, and an operation test is again conducted on a page for which a predetermined time has passed since the last test performed thereat. Also, the values of output signals of main and sub memory modules of the data processing system are compared while the data processing system is operating, and if a difference is found, that is, non-coincidence is detected, this difference is detected as a fault by the test.


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