The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 1999

Filed:

Oct. 23, 1997
Applicant:
Inventor:

Robert R Mitchell, Madison County, AL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C / ; G06F / ;
U.S. Cl.
CPC ...
702150 ; 702 94 ; 348 95 ; 35613904 ; 356400 ; 25013905 ;
Abstract

The purpose of a system for measuring the location and orientation of an ect is to align one object with another by simultaneously measuring the six degrees of freedom of the objects. The system accomplishes the purpose by employing a linear optical detector array sensor on the first object and a pre-selected target pattern on a second object to measure the six degrees of freedom and converting them to six position measurement via a microprocessor which has suitable algorithms residing in it. The six position measurements (azimuth, elevation, range, pitch, yaw and roll) are displayed for viewing by the operator who, then, manipulates the objects until pre-determined desired values of the six position measurements are obtained, indicating a complete alignment between the objects.


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