The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1999
Filed:
Jun. 07, 1995
Salvador H Talisa, Edgewood, PA (US);
David J Janocko, Forest Hills, PA (US);
Richard S Nye, Ruffsdale, PA (US);
Stanley J Pieseski, Trafford, PA (US);
Daniel C Buck, Hanover, MD (US);
Paul LePage, Towson, MD (US);
William E McGann, Linthicum, MD (US);
Charles Moskowitz, Ellicott City, MD (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A high-temperature superconductive microwave delay line that operates in an essentially pure TEM field configuration in a compact assembly. The delay line is a planar signal delay line which includes first and second substrates made of first and second dielectric materials; each substrate can be LAO material. First and second patterned delay line segments having a configuration, are formed of first and second conductive materials on the obverse sides of the first and second substrates, respectively. On the reverse side of each of the first and second substrates, respective first and second ground planes are formed using respective first and second conductive materials, which are preferred to be high-temperature superconductive films, such as YBCO films. The delay line also includes coupling means for coupling the first patterned delay line segment to the second patterned delay line segment, thus bringing the two patterned delay line segments into substantial contact.