The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 1999

Filed:

Sep. 11, 1997
Applicant:
Inventor:

Hiromu Nakazawa, Tokorozawa-shi Saitama-ken, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B / ;
U.S. Cl.
CPC ...
39550023 ; 36446801 ;
Abstract

Several levels of a plurality (n) of design parameters of a product are inputted to means for designing trial products to output a trial product list based on a given orthogonal table (step 201). The products designed by the trial product designing are evaluated for a plurality (m) of evaluation items to afford evaluation data (step 203). A system range for each level is obtained from the evaluation data for the design parameter (step 204). The deducing means calculates an amount of information for each level from the system range and a design range for each level and adds the amounts of information for all of the evaluation items to find a total amount of information for each level (step 206). A characteristic curve for the design parameter is depicted based on the total amounts of information and a value of design parameter giving a minimum total amount of information is determined and employed as an optimum value of the design parameter (step 208). Optimum values of the other design parameters are similarly determined to afford optimum values for all of the design parameters (n). According to the method and system of the present invention, it is possible to efficiently an extremely easily determine optimum values of design parameters in a short period of time.


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Nakazawa, Hiromu. (1999). Method of determining optimum product design parameters and system (U.S. Patent No. 5974246). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5974246

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