The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1999
Filed:
Mar. 31, 1997
Yongchun Lee, Rochester, NY (US);
Quinton Lamar Sowell, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method for scanning and detecting number and skew angle of photographs (12) and removing edge artifacts is disclosed. A plurality of photograph is placed on a scanner (11). A low resolution scan (34) is conducted of the photographs (12) to produce a plurality of low resolution images. A plurality of polygons is constructed, wherein each polygon contains at least one low resolution image. A number of polygons is determined and compared to the number of photographs. If the number of polygons is less than the number of photographs, the photographs are repositioned to separate overlapped photographs and the low resolution is repeated. A skew angle and location is determined for each of the photographs. A first photograph is selected and the first photograph is scanned at a high resolution to produce a high resolution image. The high resolution image is deskewed and cropped to remove the edge artifacts.