The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 1999

Filed:

Mar. 28, 1997
Applicant:
Inventors:

Jeffrey Lubin, South Orange, NJ (US);

Michael Henry Brill, Morrisville, PA (US);

Aalbert De Vries, Lawrenceville, NJ (US);

Olga Finard, Princeton, NJ (US);

Assignee:

Sarnoff Corporation, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T / ; G06T / ;
U.S. Cl.
CPC ...
382106 ; 382154 ; 382162 ; 382255 ; 382274 ; 382279 ; 382302 ;
Abstract

A method and apparatus for assessing the visibility of differences between two input image sequences. The apparatus comprises a visual discrimination measure having a retinal sampling section, a plurality of temporal filters and a spatial discrimination section. The retinal sampling section applies a plurality of transformations to the input image sequences for simulating the image-processing properties of human vision. The temporal filters separate the sequences of retinal images into two temporal channels producing a lowpass temporal response and a bandpass temporal response. The spatial discrimination section applies spatial processing to the temporal responses to produce an image metric which is used to assess the visibility of differences between the two input image sequences.


Find Patent Forward Citations

Loading…