The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1999
Filed:
Jul. 11, 1997
Karsten Wendt, Obertshausen, DE;
Peter Schramm, Frankfurt, DE;
MAN Roland Druckmaschinen AG, , DE;
Abstract
The invention relates to a method and to a corresponding device for detecting spectral reflectance, an illuminating device arranged in a stationary fashion being used to apply to measuring fields moving relative to the measuring system radiation which differs in strength as a function of the relative speed, and the radiation reflected by the measuring fields being further processed after photoelectric conversion to derive measured variables. It is the object of the present invention to develop such a method as well as a corresponding device so that the optical reflectance-measuring system can be optimally adapted to different relative speeds given a prescribed measuring field size. This is achieved according to the invention, by controlling the light source of the illuminating device as a function of the relative speed between the measuring field and measuring system so that the spectral intensity distribution of the light source of the illuminating device is detected for the respective relative speed between the measuring fields and measuring system, and by taking into account the respectively present spectral intensity distribution of the light source of the illuminating device in processing the radiation reflected by the measuring fields to obtain measured values.