The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1999
Filed:
Jan. 09, 1998
Kenneth Lee Perdue, Franklin, IN (US);
William Patrick McCarthy, Indianapolis, IN (US);
Donald D Cummings, Greenwood, IN (US);
Gerd Wartmann, Greenwood, IN (US);
Endress + Hauser GmbH + Co., Maulburg, DE;
Abstract
A method for processing a time domain reflectometry (TDR) signal having a plurality of reflection pulses to generate a valid output result corresponding to a process variable for a material in a vessel. The method includes the steps of determining a background signal for a probe and detecting a sample TDR signal for the probe in the vessel. At least one transition point is established on the sample TDR signal and the background signal. A portion of the sample TDR signal on one side of the at least one transition point is combined with a portion of the background signal on the other side of the at least one transition point to establish an initial boundary signal, and the initial boundary signal is stored. The method also includes the steps of detecting the TDR signal and calculating the output result using the initial boundary signal.