The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 1999

Filed:

Jul. 23, 1997
Applicant:
Inventor:

Hidechika Hayashi, Kanagawa, JP;

Assignee:

Tosoh Corporation, Yamaguchi, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
2504581 ; 250353 ; 4352887 ; 356317 ;
Abstract

A fluorescence detection apparatus is provided which has a partial reflection mirror 8 for transmitting a part of fluorescence light emitted from a fluorescent substance by projecting excitation light and reflecting the rest of the fluorescence light, and a pair of a first and a second photodiode 2,3 for measuring the light transmitted through or reflected by partial reflection mirror 8 respectively at a selected wavelength, and the pair of the first and the second diodes are arranged to be optically equivalent relative to the partial reflection mirror 8. This fluorescence detection apparatus is affected less by positional deviation of the measurement cell relative to the optical measurement system.


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