The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 26, 1999

Filed:

Jan. 30, 1998
Applicant:
Inventors:

Yasufumi Fukuma, Tokyo, JP;

Yukio Ikezawa, Tokyo, JP;

Takeyuki Kato, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C / ;
U.S. Cl.
CPC ...
351 44 ; 356124 ;
Abstract

A lens specifying apparatus is provided which includes a lens meter (1) for measuring and obtaining the lens refraction characteristic distribution information of a subject lens (30), an information recording/regeneration unit (104) on which lens information has been recorded, an arithmetic control circuit (101a) for comparing the lens refraction characteristic distribution information measured by the lens meter (1) with the lens information recorded on the information recording/regeneration unit (104) and judging to which lens information the measured lens refraction characteristic distribution information corresponds.


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