The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 1999
Filed:
Jan. 29, 1998
Joseph W Brophy, San Antonio, TX (US);
Hegeon Kwun, San Antonio, TX (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
A method for determining changes in the average wall thickness or the mean radius of a pipe or tube using ultrasonic and/or magnetostrictive wave probes by analyzing the dispersive behavior of waves traveling in the tube wall volume. The method examines certain wave propagation modes and identifies a cut-off frequency that is characteristic for a particular wall thickness or tube diameter. This method permits the rapid and accurate inspection of a length of pipe or tube from a single location on the inside diameter of the pipe and permits a comparison of data gathered with similar data for the structure in its original condition. Changes in the cut-off frequency, indirectly determined by the method of the present invention are inversely related to changes in the wall thickness and/or the mean radius for the cylindrical structure. In this manner the method of the present invention provides a mechanism for determining the remaining service life for such pipes and tubes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile