The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 1999

Filed:

Jun. 02, 1997
Applicant:
Inventors:

Donald Jon Sauer, Allentown, NJ (US);

Peter Alan Levine, Trenton, NJ (US);

Assignee:

Sarnoff Corporation, Princeton, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348241 ; 348308 ;
Abstract

An imaging system and method for correcting for differences between correlated double sampling (CDS) circuits of a row of CDS circuits of an imager of the imaging system. According to one embodiment, a plurality of gain correction coefficients having an initial value and a plurality of dc offset correction coefficients having an initial value are stored. A reference dc offset value and a reference gain value are determined, and a dc offset value and a gain value for each CDS circuit is determined. The dc offset value and gain value for each CDS circuit is compared to the reference dc offset value and reference gain value, respectively, and the plurality of gain correction coefficients and the plurality of dc offset correction coefficients is updated in accordance with the comparisons.


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