The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 1999
Filed:
Jun. 26, 1996
Eric Buckley, Scarborough, CA;
Branko Bukal, Thornhill, CA;
Wayne Dawe, Richmond Hill, CA;
Paul Farrer, Scarborough, CA;
Karoly G Nemeth, Don Mills, CA;
Andrew Noonan, Oshawa, CA;
Image Processing Systems Inc., Ontario, CA;
Abstract
A test and alignment system for an electronic display device comprises a test pattern generator to be connected to an electronic display device for causing images of video test patterns to be displayed by the electronic display device. A test fixture is positioned in front of the electronic display device to be tested and aligned. The test fixture includes a frame supporting a plurality of close-up optical sensors to sense and produce image signals corresponding to small areas of images displayed on the electronic display device and a plurality of wide-angle optical sensors behind the close-up optical sensors for sensing and producing image signals corresponding to large areas of images displayed on the electronic display device. A computer controls the test pattern generator and processes and analyses the image signals generated by the close-up and wide-angle optical sensors to perform a series of tests on the electronic display device. A display provides a visual indication of the results of the series of tests performed by the computer.