The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 1999
Filed:
Apr. 30, 1997
Minoru Usui, Shiojiri, JP;
Takahiro Katakura, Okaya, JP;
Takaichi Wada, Suwa, JP;
Motonori Okumura, Suwa, JP;
Nobuo Takahashi, Owariasahi, JP;
Natsumi Shimogawa, Nagoya, JP;
Keizo Miyata, Ichinomiya, JP;
Seiko Epson Corporation, , JP;
NGK Insulators, Ltd., , JP;
Abstract
A method of inspecting a crack in a ceramic substrate that is not exposed on the surface. The method can detect all cracks and make objective judgement possible by expressing the inspection result as numerical data. Conductors are disposed on both faces of a ceramic substrate, wherein one of the conductors is a conductive liquid; the insulation resistance value or an electric property dependent on the insulation resistance is measured with the conductive liquid or other conductors electrically connected to the conductive liquid which are used as electrodes.