The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 1999

Filed:

Nov. 19, 1996
Applicant:
Inventor:

Toshiyuki Kishi, Tokorozawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
257350 ; 257354 ; 257369 ;
Abstract

An MOS device including a p-channel semiconductor device and an n-channel semiconductor device, which are formed on top of an SOI substrate consisting of a supporting substrate, an insulation film, and a semiconductor layer patterned in a plurality of islands. In the peripheral region of respective islands of the semiconductor layer, boundary films, thicker than respective gate oxide films, are formed, and a boundary film formed on the semiconductor layer for the n-channel semiconductor device is thinner than another boundary film formed on the semiconductor layer for the p-channel semiconductor device. A field doped layer 11 may be preferably provided in the peripheral region of the semiconductor layer of the n-channel semiconductor device 41. In the MOS device fabricated as above, leakage current that occurs in a parasitic MOS region in an environment under exposure to radiation is reduced, ensuring stable operation.


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