The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 1999
Filed:
Oct. 14, 1997
Donald J Stavely, Windsor, CO (US);
Daniel M Bloom, Loveland, CO (US);
Amy E Battles, Greeley, CO (US);
David K Campbell, Loveland, CO (US);
Oscar R Herrera E, Greeley, CO (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A method and apparatus for detecting surface defects and artifacts on a transmissive image in an optical image scanner and correcting the resulting scanned image. In one scan, the image is scanned normally. Surface defects and artifacts such as dust, scratches and finger prints are detected by providing a separate scan using infrared light or by measuring light (white or infrared) that is scattered or diffracted by the defects and artifacts. Separate optical paths for illumination may be used, or separate optical paths for intensity measurement may be used. Image processing may then be used to correct areas in the normal scan corresponding to defects identified in the separate scan.