The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 1999
Filed:
May. 30, 1997
Maria Q Feng, Newport Beach, CA (US);
Dong Chu, Irvine, CA (US);
Other;
Abstract
Displacement is measured using two overlaid parallel optic gratings as the sensing elements of a sensor head. Optic fibers are employed as the transmission media between the sensor head and a central signal processing unit. The light intensity signals of Moire fringes generated by the overlaid optic gratings are transmitted through optic fibers to the central signal processing unit. By digitally counting the number of Moire fringes, the changes in both direction and magnitude of the displacement are measured. A number of sensor heads employing the overlaid optic gratings as sensing elements are multiplexed through a common optic fiber link to comprise a multipoint sensor system. By similarly modifying the sensor head, this sensor system also measures other physical quantities such as strain, acceleration, and pressure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile