The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 1999
Filed:
Apr. 18, 1996
Donald K McAlister, Apex, NC (US);
John T Eagan, Jr, Cary, NC (US);
Troxler Electronics Laboratories, Inc., Research Traingle Park, NC (US);
Abstract
An apparatus and method for testing rutting susceptibility of test specimens. The apparatus includes a specimen holder having cavities for receiving one or more test specimens having an exposed surface for testing. A load bearing surface is positioned above the specimens to prevent friction from effecting the rutting analysis. A load device including at least one loading wheel is positioned adjacent the specimen holder wherein the loading wheels matingly engage the load bearing device. A motive sources provides relative rotational movement between the specimen holder and the loading wheels whereby a load is repeatedly applied to the test specimens under a constant velocity. The method includes testing rutting susceptibility of test specimens by providing a rotational load thereupon whereby the load reflects a linear or constant load across the predetermined path of travel of the loading wheels over the exposed surface of the test specimens.