The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 1999
Filed:
Dec. 18, 1997
Carl-Zeiss-Stiftung, Heidenheim, DE;
Abstract
The invention is directed to a method which is provided for controlling coordinate measuring apparatus wherein a probe head (2) is moved and has a movably attached probe unit (24) attached thereto. The probe unit (24) is charged with a measurement force Fmeas relative to the probe head (2). The measurement force Fmeas operates against the mass inertial forces Fzp which occur because of acceleration of the probe. The measurement force Fmeas is comprised of a desired measurement force Fdes and a corrective measurement force Fcorr. The desired measurement force Fdes is constant in magnitude and is directed perpendicularly to the surface of the workpiece (15) to be measured. The corrective measurement force Fcorr at least partially compensates for the mass inertial forces (Ftr, Fzp) which occur because of the acceleration of the probe unit (24).